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Evaluation of the minority carrier lifetime and diffusion coefficient of cast polycrystalline silicon wafers by the dual mercury probe method
Evaluation of the minority carrier lifetime and diffusion coefficient of cast polycrystalline silicon wafers by the dual mercury probe method
Evaluation of the minority carrier lifetime and diffusion coefficient of cast polycrystalline silicon wafers by the dual mercury probe method
Suzuki, E. (author) / Hayashi, Y. (author)
APPLIED SURFACE SCIENCE ; 63 ; 218
1993-01-01
218 pages
Article (Journal)
Unknown
DDC:
621.35
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