A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Single-electron tunneling in double-barrier junctions by scanning tunneling microscopy
Single-electron tunneling in double-barrier junctions by scanning tunneling microscopy
Single-electron tunneling in double-barrier junctions by scanning tunneling microscopy
Schoenenberger, C. (author) / Van Houten, H. (author) / Kerkhof, J. M. (author) / Donkersloot, H. C. (author)
APPLIED SURFACE SCIENCE ; 67 ; 222
1993-01-01
222 pages
Article (Journal)
Unknown
DDC:
621.35
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