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    Microstructural and compositional characterization of TiW/Al(0.8%Si)/TiW/PtSi/(100)Si

    New search for: Ashkenazi, A.
    New search for: Komem, Y.
    New search for: Lerner, I.

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    Microstructural and compositional characterization of TiW/Al(0.8%Si)/TiW/PtSi/(100)Si

    New search for: Ashkenazi, A.
    New search for: Komem, Y.
    New search for: Lerner, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructural and compositional characterization of TiW/Al(0.8%Si)/TiW/PtSi/(100)Si

    New search for: Ashkenazi, A.
    New search for: Komem, Y.
    New search for: Lerner, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Microstructural and compositional characterization of TiW/Al(0.8%Si)/TiW/PtSi/(100)Si

    Contributors:

    Ashkenazi, A. (author) / Komem, Y. (author) / Lerner, I. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 65//66 ; 746

    Publication date:

    1993-01-01

    Size:

    746 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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