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    Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes

    New search for: Jin, S.
    New search for: Bender, H.
    New search for: Donaton, R. A.
    New search for: Maex, K.

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    Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes

    New search for: Jin, S.
    New search for: Bender, H.
    New search for: Donaton, R. A.
    New search for: Maex, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes

    New search for: Jin, S.
    New search for: Bender, H.
    New search for: Donaton, R. A.
    New search for: Maex, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes

    Contributors:

    Jin, S. (author) / Bender, H. (author) / Donaton, R. A. (author) / Maex, K. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 2577-2587

    Publication date:

    1999-01-01

    Size:

    11 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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