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Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes

Deen, M. J.

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Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes

Deen, M. J.

Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes

Deen, M. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes

Contributors:

Deen, M. J. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 20 ; 207

Publication date:

1993-01-01

Size:

207 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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