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Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes
Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes
Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes
Deen, M. J. (Autor:in)
01.01.1993
207 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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