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Residual Stress Measurements on Cr/Ni Pads Evaporated on Polyimide Thin Films

Goldsmith, C. C. / Van Buskirk, C.

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Residual Stress Measurements on Cr/Ni Pads Evaporated on Polyimide Thin Films

Goldsmith, C. C. / Van Buskirk, C.

Residual Stress Measurements on Cr/Ni Pads Evaporated on Polyimide Thin Films

Goldsmith, C. C. / Van Buskirk, C.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Residual Stress Measurements on Cr/Ni Pads Evaporated on Polyimide Thin Films

Contributors:

Goldsmith, C. C. (author) / Van Buskirk, C. (author)

Published in:

ADVANCES IN X RAY ANALYSIS ; 203

Publication date:

1993-01-01

Size:

203 pages

ISSN:

0376-0308

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 539.7222

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