X-Ray DCD and EPMA Measurements of A1 Concentration in Epitaxial Al~xGa~1~-~xAs/GaAs Layers: Fid-Bau Portal

X-Ray DCD and EPMA Measurements of A1 Concentration in Epitaxial Al~xGa~1~-~xAs/GaAs Layers

Macquistan, D. A. / Bassignana, I. C. / SpringThorpe, A. J. / Packwood, R.

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X-Ray DCD and EPMA Measurements of A1 Concentration in Epitaxial Al~xGa~1~-~xAs/GaAs Layers

Macquistan, D. A. / Bassignana, I. C. / SpringThorpe, A. J. / Packwood, R.

X-Ray DCD and EPMA Measurements of A1 Concentration in Epitaxial Al~xGa~1~-~xAs/GaAs Layers

Macquistan, D. A. / Bassignana, I. C. / SpringThorpe, A. J. / Packwood, R.

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Check availability in my library

Order at Subito €

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Document information

Title:

X-Ray DCD and EPMA Measurements of A1 Concentration in Epitaxial Al~xGa~1~-~xAs/GaAs Layers

Contributors:

Macquistan, D. A. (author) / Bassignana, I. C. (author) / SpringThorpe, A. J. (author) / Packwood, R. (author)

Published in:

ADVANCES IN X RAY ANALYSIS ; 221

Publication date:

1993-01-01

Size:

221 pages

ISSN:

0376-0308

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 539.7222

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