Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)

Ballard, B. L. / Predecki, P. K. / Braski, D. N. | British Library Online Contents | 1994

Proposed Methods for Depth Profiling of Residual Stresses Using Beam-Limiting Masks

Predecki, P. / Ballard, B. / Zhu, X. | British Library Online Contents | 1993

In-Depth Distribution of Stresses Measured by Multireflection Grazing Incidence Diffraction

Marciszko, M. / Stanislawczyk, A. / Baczmanski, A. et al. | British Library Online Contents | 2014

GIXD (Grazing Incidence X-Ray Diffraction) as a Tool for the In Situ Investigation of Electrochemical Reactions of Metals in Electrolyte Solutions: The Lead Electrode in 5 M Sulphuric Acid

Nauer, G. E. | British Library Online Contents | 1996

Depth profiling of near-surface information in a functionally graded alumina/aluminium titanate composite using grazing-incidence synchrotron radiation diffraction

Singh, M. / Manurung, P. / Low, I. M. | British Library Online Contents | 2002