Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Applications of Secondary Ion Mass Spectrometry (SIMS) in Materials Science

    New search for: McPhail, D. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Applications of Secondary Ion Mass Spectrometry (SIMS) in Materials Science

    New search for: McPhail, D. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Applications of Secondary Ion Mass Spectrometry (SIMS) in Materials Science

    New search for: McPhail, D. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Applications of Secondary Ion Mass Spectrometry (SIMS) in Materials Science

    Contributors:

    McPhail, D. S. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 41 ; 873-903

    Publication date:

    2006-01-01

    Size:

    31 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    SIMS: Secondary Ion Mass Spectrometry

    Kudo, M. / Nagayama, S. | British Library Online Contents | 1993

    SIMS — Secondary Ion Mass Spectrometry

    MacDonald, R. J. / King, B. V. | Springer Verlag | 1992

    Fast atom beam bombardment secondary ion mass spectrometry: FAB-SIMS

    Hayashi, H. / Satake, T. / Kaneko, K. et al. | British Library Online Contents | 1993

    Characterization of drug-eluting stent (DES) materials with cluster secondary ion mass spectrometry (SIMS)

    Mahoney, C. M. / Patwardhan, D. V. / Ken McDermott, M. | British Library Online Contents | 2006

    Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

    Mahoney, C. M. / Fahey, A. J. / Gillen, G. et al. | British Library Online Contents | 2006

    Back to top