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The morphological degradation mechanism of TiSi~2/Si structure

Hwang, Y. S. / Paek, S. H. / Kim, H. S. / Cho, H. C.

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The morphological degradation mechanism of TiSi~2/Si structure

Hwang, Y. S. / Paek, S. H. / Kim, H. S. / Cho, H. C.

The morphological degradation mechanism of TiSi~2/Si structure

Hwang, Y. S. / Paek, S. H. / Kim, H. S. / Cho, H. C.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

The morphological degradation mechanism of TiSi~2/Si structure

Contributors:

Hwang, Y. S. (author) / Paek, S. H. (author) / Kim, H. S. (author) / Cho, H. C. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 12 ; 1682

Publication date:

1993-01-01

Size:

1682 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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