Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    The influence of silicon substrate crystallinity and doping on TiSi~2 thin film morphology

    New search for: Karlin, T. E.
    New search for: Nygren, S.
    New search for: Mattsson, L.
    New search for: Andre, E.
    New search for: Janssen, G. C. A. M.
    New search for: Jongste, J. F.
    New search for: Radelaar, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    The influence of silicon substrate crystallinity and doping on TiSi~2 thin film morphology

    New search for: Karlin, T. E.
    New search for: Nygren, S.
    New search for: Mattsson, L.
    New search for: Andre, E.
    New search for: Janssen, G. C. A. M.
    New search for: Jongste, J. F.
    New search for: Radelaar, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The influence of silicon substrate crystallinity and doping on TiSi~2 thin film morphology

    New search for: Karlin, T. E.
    New search for: Nygren, S.
    New search for: Mattsson, L.
    New search for: Andre, E.
    New search for: Janssen, G. C. A. M.
    New search for: Jongste, J. F.
    New search for: Radelaar, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    The influence of silicon substrate crystallinity and doping on TiSi~2 thin film morphology

    Contributors:

    Karlin, T. E. (author) / Nygren, S. (author) / Mattsson, L. (author) / Andre, E. (author) / Janssen, G. C. A. M. / Jongste, J. F. / Radelaar, S.

    Published in:

    Proceedings of the Fifth European Workshop on Refractory Metals and Silicides ; 280

    APPLIED SURFACE SCIENCE ; 72

    Publication date:

    1993-01-01

    Size:

    280 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Depth Profiling of Thin TiSi~x-Films on Silicon Carbide by SNMS

    Getto, R. / Freytag, J. / Kopnarski, M. et al. | British Library Online Contents | 1998

    Structure, Morphology, and Kinetics of the C49 to C54 Phase Transformation in TiSi~2 Thin Films

    Bocelli, S. / Marabelli, F. / Iannuzzi, M. et al. | British Library Conference Proceedings | 1998

    Crystallinity and morphology dependent luminescence of Li-doped Y2-xGdxO3:Eu3+ thin film phosphors

    Bae, J. S. / Jeong, J. H. / Shim, K. S. et al. | British Library Online Contents | 2006

    Characteristics of TiSi~2 contact to BF~2-doped single-silicon

    Choi, J. S. / Paek, S. H. / Hwang, Y. S. et al. | British Library Online Contents | 1993

    Morphology of TiSi~2 and ZrSi~2 on Si(100) and (111) surfaces

    Sukow, C. A. / Nemanich, R. J. | British Library Online Contents | 1994

    Back to top