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Au-Related Deep States in the Presence of Extended Defects in n-type Silicon

Kaniewska, M. / Kaniewski, J. / Peaker, A. R.

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Au-Related Deep States in the Presence of Extended Defects in n-type Silicon

Kaniewska, M. / Kaniewski, J. / Peaker, A. R.

Au-Related Deep States in the Presence of Extended Defects in n-type Silicon

Kaniewska, M. / Kaniewski, J. / Peaker, A. R.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

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Document information

Title:

Au-Related Deep States in the Presence of Extended Defects in n-type Silicon

Contributors:

Kaniewska, M. (author) / Kaniewski, J. (author) / Peaker, A. R. (author)

Published in:

MATERIALS SCIENCE FORUM ; 1511

Publication date:

1993-01-01

Size:

1511 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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