A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
High resolution EELS study of extended defects in silicon
High resolution EELS study of extended defects in silicon
High resolution EELS study of extended defects in silicon
Kohno, H. (author) / Arai, N. (author) / Mabuchi, T. (author) / Hirata, M. (author) / Takeda, S. (author) / Kohyama, M. (author) / Terauchi, M. (author) / Tanaka, M. (author)
MATERIALS SCIENCE FORUM ; 258/263 ; 547-552
1997-01-01
6 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
EELS investigation of luminescent nanoporous p-type silicon
| British Library Online Contents | 1996
EELS and Ab-Initio Study of Faceted CSL Boundary in Silicon
| British Library Online Contents | 2011
British Library Online Contents | 2004
| Online Contents | 1997
High Resolution DLTS Studies of Transition-Metal-Related Defects in Silicon
| British Library Online Contents | 1995