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Electronic properties of nanometer-size metal-semiconductor point contacts studied by STM

Hasegawa, Y. / Lyo, I.-W. / Avouris, P.

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Electronic properties of nanometer-size metal-semiconductor point contacts studied by STM

Hasegawa, Y. / Lyo, I.-W. / Avouris, P.

Electronic properties of nanometer-size metal-semiconductor point contacts studied by STM

Hasegawa, Y. / Lyo, I.-W. / Avouris, P.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Electronic properties of nanometer-size metal-semiconductor point contacts studied by STM

Contributors:

Hasegawa, Y. (author) / Lyo, I.-W. (author) / Avouris, P. (author)

Published in:

APPLIED SURFACE SCIENCE ; 76/77 ; 347

Publication date:

1994-01-01

Size:

347 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

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