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    Depth profiling of InAs/InP and In~xGa~1~-~xAs/InAs heterostructures grown by molecular beam epitaxy

    New search for: Bruni, M. R.
    New search for: Gambacorti, N.
    New search for: Kaciulis, S.
    New search for: Mattogno, G.
    New search for: Fornari, R.

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    Depth profiling of InAs/InP and In~xGa~1~-~xAs/InAs heterostructures grown by molecular beam epitaxy

    New search for: Bruni, M. R.
    New search for: Gambacorti, N.
    New search for: Kaciulis, S.
    New search for: Mattogno, G.
    New search for: Fornari, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Depth profiling of InAs/InP and In~xGa~1~-~xAs/InAs heterostructures grown by molecular beam epitaxy

    New search for: Bruni, M. R.
    New search for: Gambacorti, N.
    New search for: Kaciulis, S.
    New search for: Mattogno, G.
    New search for: Fornari, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Depth profiling of InAs/InP and In~xGa~1~-~xAs/InAs heterostructures grown by molecular beam epitaxy

    Contributors:

    Bruni, M. R. (author) / Gambacorti, N. (author) / Kaciulis, S. (author) / Mattogno, G. (author) / Fornari, R.

    Published in:

    2nd International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies ; 228

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 28

    Publication date:

    1994-01-01

    Size:

    228 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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