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    Application of angle resolved X-ray photoelectron spectroscopy to the study of GaAs (001) surfaces and metal/GaAs (001) interfaces

    New search for: Lepine, B.
    New search for: Quemerais, A.
    New search for: Jezequel, G.
    New search for: Pollini, I.
    New search for: Fornani, R.

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    Application of angle resolved X-ray photoelectron spectroscopy to the study of GaAs (001) surfaces and metal/GaAs (001) interfaces

    New search for: Lepine, B.
    New search for: Quemerais, A.
    New search for: Jezequel, G.
    New search for: Pollini, I.
    New search for: Fornani, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Application of angle resolved X-ray photoelectron spectroscopy to the study of GaAs (001) surfaces and metal/GaAs (001) interfaces

    New search for: Lepine, B.
    New search for: Quemerais, A.
    New search for: Jezequel, G.
    New search for: Pollini, I.
    New search for: Fornani, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Application of angle resolved X-ray photoelectron spectroscopy to the study of GaAs (001) surfaces and metal/GaAs (001) interfaces

    Contributors:

    Lepine, B. (author) / Quemerais, A. (author) / Jezequel, G. (author) / Pollini, I. (author) / Fornani, R.

    Published in:

    2nd International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies ; 527

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 28

    Publication date:

    1994-01-01

    Size:

    527 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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