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Defect profiling in multilayered systems using mean depth scaling

Aers, G. C. / Marshall, P. A. / Leung, T. C. / Goldberg, R. D.

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Defect profiling in multilayered systems using mean depth scaling

Aers, G. C. / Marshall, P. A. / Leung, T. C. / Goldberg, R. D.

Defect profiling in multilayered systems using mean depth scaling

Aers, G. C. / Marshall, P. A. / Leung, T. C. / Goldberg, R. D.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Defect profiling in multilayered systems using mean depth scaling

Contributors:

Aers, G. C. (author) / Marshall, P. A. (author) / Leung, T. C. (author) / Goldberg, R. D. (author) / Doyama, M. / Akahane, T. / Fujinami, M.

Published in:

Proceedings of the Sixth International Workshop on Slow-Positron Beam Techniques for Solids and Surfaces ; 196

APPLIED SURFACE SCIENCE ; 85

Publication date:

1995-01-01

Size:

196 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

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