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Defect analysis using 2D-ACAR: GaAs as a test case

Manuel, A. A. / Ambigapathy, R. / Saarinen, K. / Hautojaervi, P.

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Defect analysis using 2D-ACAR: GaAs as a test case

Manuel, A. A. / Ambigapathy, R. / Saarinen, K. / Hautojaervi, P.

Defect analysis using 2D-ACAR: GaAs as a test case

Manuel, A. A. / Ambigapathy, R. / Saarinen, K. / Hautojaervi, P.

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Check availability in my library

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Document information

Title:

Defect analysis using 2D-ACAR: GaAs as a test case

Contributors:

Manuel, A. A. (author) / Ambigapathy, R. (author) / Saarinen, K. (author) / Hautojaervi, P. (author) / Doyama, M. / Akahane, T. / Fujinami, M.

Published in:

Proceedings of the Sixth International Workshop on Slow-Positron Beam Techniques for Solids and Surfaces ; 301

APPLIED SURFACE SCIENCE ; 85

Publication date:

1995-01-01

Size:

301 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

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