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Annealing Processes of Vacancies in Silicon Induced by Electron Irradiation: Analysis Using Positron Lifetime Measurement
Annealing Processes of Vacancies in Silicon Induced by Electron Irradiation: Analysis Using Positron Lifetime Measurement
Annealing Processes of Vacancies in Silicon Induced by Electron Irradiation: Analysis Using Positron Lifetime Measurement
Kawasuso, A. (author) / Hasegawa, M. (author) / Suezawa, M. (author) / Yamaguchi, S. (author) / He, Y.-J. / Cao, B.-S. / Jean, Y. C.
1995-01-01
423 pages
Article (Journal)
Unknown
DDC:
620.11
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