Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Transmission electron microscopy characterization of a fluorine-doped Si~3N~4

    New search for: Kleebe, H.-J.
    New search for: Pezzotti, G.
    New search for: Nishida, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Transmission electron microscopy characterization of a fluorine-doped Si~3N~4

    New search for: Kleebe, H.-J.
    New search for: Pezzotti, G.
    New search for: Nishida, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Transmission electron microscopy characterization of a fluorine-doped Si~3N~4

    New search for: Kleebe, H.-J.
    New search for: Pezzotti, G.
    New search for: Nishida, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Transmission electron microscopy characterization of a fluorine-doped Si~3N~4

    Contributors:

    Kleebe, H.-J. (author) / Pezzotti, G. (author) / Nishida, T. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE LETTERS ; 14 ; 1668-1671

    Publication date:

    1995-01-01

    Size:

    4 pages

    ISSN:

    0261-8028

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Characterization of fluorine-doped silica glasses

    Kyoto, M. / Ohoga, Y. / Ishikawa, S. et al. | British Library Online Contents | 1993

    Transmission Electron Microscopy Study of Sn-Doped Sintered Indium Oxide

    Ishikawa, Y. / Nagayama, H. / Hoshino, H. et al. | British Library Online Contents | 2009

    Nanostructured PLD-grown gadolinia doped ceria: Chemical and structural characterization by transmission electron microscopy techniques

    Rodrigo, K. / Wang, H. J. / Heiroth, S. et al. | British Library Online Contents | 2011

    Defects characterization of welded specimens by transmission electron microscopy

    Roy, A. K. / Chanda, S. / Ghosh, A. et al. | British Library Online Contents | 2007

    Scanning IR microscopy and transmission electron microscopy studies of inhomogeneities in LEC S-doped InP

    Jin, N. Y. / Booker, G. R. / Grant, I. R. | British Library Online Contents | 1993

    Back to top