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Depth profiling of W, O and H in tungsten trioxide thin films using RBS and ERDA techniques
Depth profiling of W, O and H in tungsten trioxide thin films using RBS and ERDA techniques
Depth profiling of W, O and H in tungsten trioxide thin films using RBS and ERDA techniques
Bohnke, O. (author) / Frand, G. (author) / Fromm, M. (author) / Weber, J. (author) / Greim, O. (author)
APPLIED SURFACE SCIENCE ; 93 ; 45-52
1996-01-01
8 pages
Article (Journal)
English
DDC:
621.35
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