Optical and electrical non-uniformity around dislocations in silicon doped GaAs

Tajima, M. / Toba, R. / Ishida, N. et al. | British Library Online Contents | 1997

Defect processes causing free carrier variations around dislocations in n-type doped GaAs

Paetzold, O. / Sonnenberg, K. / Irmer, G. | British Library Online Contents | 1997

Microdefects in Nitrogen Doped FZ Silicon Revealed By Li^+ Drifting

Knowlton, W. B. / Walton, J. T. / Lee, J. S. et al. | British Library Online Contents | 1995

Identification of individual and aligned microdefects in bulk vertical Bridgman- and liquid encapsulated Czochralski-grown GaAs

Weyher, J. L. / Schober, T. / Sonnenberg, K. et al. | British Library Online Contents | 1998

Microcracks size growth prediction based on microdefects nucleation number

Wang, L. / Ye, J. / Mao, Y. et al. | British Library Online Contents | 2013