Scanning electron microscopy observations of misfit dislocations in epitaxial In~0~.~2~5Ga~0~.~7~5As on GaAs(001): Fid-Bau Portal

Scanning electron microscopy observations of misfit dislocations in epitaxial In~0~.~2~5Ga~0~.~7~5As on GaAs(001)

Keller, R. R. / Phelps, J. M.

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Scanning electron microscopy observations of misfit dislocations in epitaxial In~0~.~2~5Ga~0~.~7~5As on GaAs(001)

Keller, R. R. / Phelps, J. M.

Scanning electron microscopy observations of misfit dislocations in epitaxial In~0~.~2~5Ga~0~.~7~5As on GaAs(001)

Keller, R. R. / Phelps, J. M.

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Check availability in my library

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Document information

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Document information

Title:

Scanning electron microscopy observations of misfit dislocations in epitaxial In~0~.~2~5Ga~0~.~7~5As on GaAs(001)

Contributors:

Keller, R. R. (author) / Phelps, J. M. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 11 ; 552-554

Publication date:

1996-01-01

Size:

3 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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