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    Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots

    New search for: Fernández-Delgado, N.
    New search for: Herrera, M.
    New search for: Chisholm, M. F.
    New search for: Kamarudin, M. A.
    New search for: Zhuang, Q. D.
    New search for: Hayne, M.
    New search for: Molina, S. I.

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    Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots

    New search for: Fernández-Delgado, N.
    New search for: Herrera, M.
    New search for: Chisholm, M. F.
    New search for: Kamarudin, M. A.
    New search for: Zhuang, Q. D.
    New search for: Hayne, M.
    New search for: Molina, S. I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots

    New search for: Fernández-Delgado, N.
    New search for: Herrera, M.
    New search for: Chisholm, M. F.
    New search for: Kamarudin, M. A.
    New search for: Zhuang, Q. D.
    New search for: Hayne, M.
    New search for: Molina, S. I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
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    Document information
    Title:

    Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots

    Contributors:

    Fernández-Delgado, N. (author) / Herrera, M. (author) / Chisholm, M. F. (author) / Kamarudin, M. A. (author) / Zhuang, Q. D. (author) / Hayne, M. (author) / Molina, S. I. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 51 ; 7691-7698

    Publication date:

    2016-01-01

    Size:

    8 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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