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In situ X-ray reflectivity measurement of thin film growth during vacuum deposition

Lee, C.-H. / Tseng, S.-Y.

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In situ X-ray reflectivity measurement of thin film growth during vacuum deposition

Lee, C.-H. / Tseng, S.-Y.

In situ X-ray reflectivity measurement of thin film growth during vacuum deposition

Lee, C.-H. / Tseng, S.-Y.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

In situ X-ray reflectivity measurement of thin film growth during vacuum deposition

Contributors:

Lee, C.-H. (author) / Tseng, S.-Y. (author)

Published in:

APPLIED SURFACE SCIENCE ; 92 ; 282-286

Publication date:

1996-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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