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    Angle-Scanned Photoelectron Diffraction: Probing Crystalline Ultrathin Films

    New search for: Granozzi, G.
    New search for: Sambi, M.

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    Angle-Scanned Photoelectron Diffraction: Probing Crystalline Ultrathin Films

    New search for: Granozzi, G.
    New search for: Sambi, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Angle-Scanned Photoelectron Diffraction: Probing Crystalline Ultrathin Films

    New search for: Granozzi, G.
    New search for: Sambi, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Angle-Scanned Photoelectron Diffraction: Probing Crystalline Ultrathin Films

    Contributors:

    Granozzi, G. (author) / Sambi, M. (author)

    Published in:

    ADVANCED MATERIALS -DEERFIELD BEACH- ; 8 ; 315-326

    Publication date:

    1996-01-01

    Size:

    12 pages

    ISSN:

    0935-9648

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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