Structural determination for H~2O adsorption on Si(001)2 x 1 using scanned-energy mode photoelectron diffraction: Fid-Bau Portal

Structural determination for H~2O adsorption on Si(001)2 x 1 using scanned-energy mode photoelectron diffraction

Franco, N. / Chrost, J. / Avila, J. / Asensio, M. C. / Mueller, C. / Dudzik, E. / Patchett, A. J. / McGovern, I. T. / Giebel, T. / Lindsay, R.

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Structural determination for H~2O adsorption on Si(001)2 x 1 using scanned-energy mode photoelectron diffraction

Franco, N. / Chrost, J. / Avila, J. / Asensio, M. C. / Mueller, C. / Dudzik, E. / Patchett, A. J. / McGovern, I. T. / Giebel, T. / Lindsay, R.

Structural determination for H~2O adsorption on Si(001)2 x 1 using scanned-energy mode photoelectron diffraction

Franco, N. / Chrost, J. / Avila, J. / Asensio, M. C. / Mueller, C. / Dudzik, E. / Patchett, A. J. / McGovern, I. T. / Giebel, T. / Lindsay, R.

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Title:

Structural determination for H~2O adsorption on Si(001)2 x 1 using scanned-energy mode photoelectron diffraction

Contributors:

Franco, N. (author) / Chrost, J. (author) / Avila, J. (author) / Asensio, M. C. (author) / Mueller, C. (author) / Dudzik, E. (author) / Patchett, A. J. (author) / McGovern, I. T. (author) / Giebel, T. (author) / Lindsay, R. (author)

Published in:

APPLIED SURFACE SCIENCE ; 123/124 ; 219-222

Publication date:

1998-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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