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Electroreflectance spectroscopy of strained Si~1~-~xGe~x layers on silicon
Electroreflectance spectroscopy of strained Si~1~-~xGe~x layers on silicon
Electroreflectance spectroscopy of strained Si~1~-~xGe~x layers on silicon
Ebner, T. (author) / Thonke, K. (author) / Sauer, R. (author) / Schaeffler, F. (author) / Herzog, H. J. (author)
APPLIED SURFACE SCIENCE ; 102 ; 90-93
1996-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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