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Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate
Frangis, N. (author) / Van Tendeloo, G. (author) / Van Landuyt, J. (author) / Muret, P. (author) / Nguyen, T. T. A. (author)
APPLIED SURFACE SCIENCE ; 102 ; 163-168
1996-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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