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Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate
Frangis, N. (Autor:in) / Van Tendeloo, G. (Autor:in) / Van Landuyt, J. (Autor:in) / Muret, P. (Autor:in) / Nguyen, T. T. A. (Autor:in)
APPLIED SURFACE SCIENCE ; 102 ; 163-168
01.01.1996
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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