Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)

    New search for: Dieckhoff, S.
    New search for: Schlett, V.
    New search for: Possart, W.
    New search for: Hennemann, O.-D.
    New search for: Guenster, J.
    New search for: Kempter, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)

    New search for: Dieckhoff, S.
    New search for: Schlett, V.
    New search for: Possart, W.
    New search for: Hennemann, O.-D.
    New search for: Guenster, J.
    New search for: Kempter, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)

    New search for: Dieckhoff, S.
    New search for: Schlett, V.
    New search for: Possart, W.
    New search for: Hennemann, O.-D.
    New search for: Guenster, J.
    New search for: Kempter, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)

    Contributors:

    Dieckhoff, S. (author) / Schlett, V. (author) / Possart, W. (author) / Hennemann, O.-D. (author) / Guenster, J. (author) / Kempter, V. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 103 ; 221-229

    Publication date:

    1996-01-01

    Size:

    9 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Study of Insulator Surfaces with the Metastable Impact Electron Spectroscopy (MIES)

    Kempter, V. | British Library Online Contents | 1997

    Initial oxidation of Mn surface studied by ultraviolet photoelectron spectroscopy and metastable induced electron spectroscopy

    Lescop, B. | British Library Online Contents | 2006

    Atomic and electronic structures of barium oxide on Si(0 0 1) studied by metastable impact electron spectroscopy (MIES) and coaxial impact collision ion scattering spectroscopy (CAICISS)

    Ikeuchi, T. / Souda, R. / Yamamoto, S. | British Library Online Contents | 2002

    Auger and Photoelectron Spectroscopy of Metastable Ceramic Oxynitrides

    Cremer, R. / Witthaut, M. / Neuschutz, D. et al. | British Library Conference Proceedings | 1999

    Oxygen containing silicon clusters on Teflon and their work functions studied with X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy

    Tanaka, K. / Sakamoto, T. / Tohara, M. et al. | British Library Online Contents | 1999

    Back to top