Improvement of Cs-induced surface roughness for high depth resolution profiling of CdZnSe/ZnSe multilayer films: Fid-Bau Portal

Improvement of Cs-induced surface roughness for high depth resolution profiling of CdZnSe/ZnSe multilayer films

Takakuwa, C. / Tomita, M. / Hatanaka, T. / Suzuki, I. / Franco, G. / Yamaguchi, H.

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Improvement of Cs-induced surface roughness for high depth resolution profiling of CdZnSe/ZnSe multilayer films

Takakuwa, C. / Tomita, M. / Hatanaka, T. / Suzuki, I. / Franco, G. / Yamaguchi, H.

Improvement of Cs-induced surface roughness for high depth resolution profiling of CdZnSe/ZnSe multilayer films

Takakuwa, C. / Tomita, M. / Hatanaka, T. / Suzuki, I. / Franco, G. / Yamaguchi, H.

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Document information

Title:

Improvement of Cs-induced surface roughness for high depth resolution profiling of CdZnSe/ZnSe multilayer films

Contributors:

Takakuwa, C. (author) / Tomita, M. (author) / Hatanaka, T. (author) / Suzuki, I. (author) / Franco, G. (author) / Yamaguchi, H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 103 ; 255-260

Publication date:

1996-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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