Thickness dependence of crystalline orientation in YBa~2Cu~3O~x thin films grown by metalorganic chemical vapour deposition: Fid-Bau Portal

Thickness dependence of crystalline orientation in YBa~2Cu~3O~x thin films grown by metalorganic chemical vapour deposition

Kang, W. N. / Kim, Y. H. / Kim, C. H. / Jang, J. W. / Kim, I. T. / Choi, S. S. / Hahn, T. S.

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Thickness dependence of crystalline orientation in YBa~2Cu~3O~x thin films grown by metalorganic chemical vapour deposition

Kang, W. N. / Kim, Y. H. / Kim, C. H. / Jang, J. W. / Kim, I. T. / Choi, S. S. / Hahn, T. S.

Thickness dependence of crystalline orientation in YBa~2Cu~3O~x thin films grown by metalorganic chemical vapour deposition

Kang, W. N. / Kim, Y. H. / Kim, C. H. / Jang, J. W. / Kim, I. T. / Choi, S. S. / Hahn, T. S.

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Document information

Title:

Thickness dependence of crystalline orientation in YBa~2Cu~3O~x thin films grown by metalorganic chemical vapour deposition

Contributors:

Kang, W. N. (author) / Kim, Y. H. (author) / Kim, C. H. (author) / Jang, J. W. (author) / Kim, I. T. (author) / Choi, S. S. (author) / Hahn, T. S. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 15 ; 1898-1901

Publication date:

1996-01-01

Size:

4 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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