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    Oxide thin films formed during rotational AES sputter depth profiling of Ni/Cr multilayers using oxygen ions

    New search for: Zalar, A.
    New search for: Seibt, E. W.
    New search for: Panjan, P.
    New search for: Feldman, L. C.
    New search for: Nishizawa, J.
    New search for: Van der Weg, W. F.

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    Oxide thin films formed during rotational AES sputter depth profiling of Ni/Cr multilayers using oxygen ions

    New search for: Zalar, A.
    New search for: Seibt, E. W.
    New search for: Panjan, P.
    New search for: Feldman, L. C.
    New search for: Nishizawa, J.
    New search for: Van der Weg, W. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Oxide thin films formed during rotational AES sputter depth profiling of Ni/Cr multilayers using oxygen ions

    New search for: Zalar, A.
    New search for: Seibt, E. W.
    New search for: Panjan, P.
    New search for: Feldman, L. C.
    New search for: Nishizawa, J.
    New search for: Van der Weg, W. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Oxide thin films formed during rotational AES sputter depth profiling of Ni/Cr multilayers using oxygen ions

    Contributors:

    Zalar, A. (author) / Seibt, E. W. (author) / Panjan, P. (author) / Feldman, L. C. / Nishizawa, J. / Van der Weg, W. F.

    Published in:

    A journal devoted to applied physics and chemistry of surfaces and interfaces ; 92-96

    APPLIED SURFACE SCIENCE ; 100/101

    Publication date:

    1996-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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