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    Deep-level transient spectroscopy characterization of electrical traps in p-type multicrystalline silicon with gettering and hydrogenation process

    New search for: Zheng, Xiong
    New search for: Zhou, Chunlan
    New search for: Jia, Xiaojie
    New search for: Jia, Endong
    New search for: Wang, Wenjing

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    Deep-level transient spectroscopy characterization of electrical traps in p-type multicrystalline silicon with gettering and hydrogenation process

    New search for: Zheng, Xiong
    New search for: Zhou, Chunlan
    New search for: Jia, Xiaojie
    New search for: Jia, Endong
    New search for: Wang, Wenjing

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Deep-level transient spectroscopy characterization of electrical traps in p-type multicrystalline silicon with gettering and hydrogenation process

    New search for: Zheng, Xiong
    New search for: Zhou, Chunlan
    New search for: Jia, Xiaojie
    New search for: Jia, Endong
    New search for: Wang, Wenjing

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Deep-level transient spectroscopy characterization of electrical traps in p-type multicrystalline silicon with gettering and hydrogenation process

    Contributors:

    Zheng, Xiong (author) / Zhou, Chunlan (author) / Jia, Xiaojie (author) / Jia, Endong (author) / Wang, Wenjing (author)

    Published in:

    Solar energy ; 162 ; 372-377

    Publication date:

    2018-01-01

    Size:

    6 pages

    ISSN:

    0038-092X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.47

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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