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A high resolution XPS study of a complex insulator: the case of porous silicon
A high resolution XPS study of a complex insulator: the case of porous silicon
A high resolution XPS study of a complex insulator: the case of porous silicon
Leisenberger, F. (author) / Duschek, R. (author) / Czaputa, R. (author) / Netzer, F. P. (author) / Beamson, G. (author) / Matthew, J. A. D. (author)
APPLIED SURFACE SCIENCE ; 108 ; 273-281
1997-01-01
9 pages
Article (Journal)
English
DDC:
621.35
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