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    Optical and structural studies of nanocrystalline silicon thin film grown by rapid thermal annealing

    New search for: Toyama, T.
    New search for: Ouchida, T.
    New search for: Okamoto, H.
    New search for: Hamakawa, Y.

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    Optical and structural studies of nanocrystalline silicon thin film grown by rapid thermal annealing

    New search for: Toyama, T.
    New search for: Ouchida, T.
    New search for: Okamoto, H.
    New search for: Hamakawa, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Optical and structural studies of nanocrystalline silicon thin film grown by rapid thermal annealing

    New search for: Toyama, T.
    New search for: Ouchida, T.
    New search for: Okamoto, H.
    New search for: Hamakawa, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Optical and structural studies of nanocrystalline silicon thin film grown by rapid thermal annealing

    Contributors:

    Toyama, T. (author) / Ouchida, T. (author) / Okamoto, H. (author) / Hamakawa, Y. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 113/114 ; 130-134

    Publication date:

    1997-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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