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Investigation of SiC clean surface and Ni/SiC interface using scanning tunneling microscopy
Investigation of SiC clean surface and Ni/SiC interface using scanning tunneling microscopy
Investigation of SiC clean surface and Ni/SiC interface using scanning tunneling microscopy
Hattori, N. (author) / Hirai, M. (author) / Kusaka, M. (author) / Iwami, M. (author)
APPLIED SURFACE SCIENCE ; 216 ; 54-58
2003-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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