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    High-resolution resistivity mapping of bulk semi-insulating GaAs by point-contact technique

    New search for: Siegel, W.
    New search for: Kuehnel, G.
    New search for: Reichel, C.
    New search for: Jurisch, M.
    New search for: Hoffmann, B.
    New search for: Jantz, W.
    New search for: Baeumler, M.

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    High-resolution resistivity mapping of bulk semi-insulating GaAs by point-contact technique

    New search for: Siegel, W.
    New search for: Kuehnel, G.
    New search for: Reichel, C.
    New search for: Jurisch, M.
    New search for: Hoffmann, B.
    New search for: Jantz, W.
    New search for: Baeumler, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-resolution resistivity mapping of bulk semi-insulating GaAs by point-contact technique

    New search for: Siegel, W.
    New search for: Kuehnel, G.
    New search for: Reichel, C.
    New search for: Jurisch, M.
    New search for: Hoffmann, B.
    New search for: Jantz, W.
    New search for: Baeumler, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    High-resolution resistivity mapping of bulk semi-insulating GaAs by point-contact technique

    Contributors:

    Siegel, W. (author) / Kuehnel, G. (author) / Reichel, C. (author) / Jurisch, M. (author) / Hoffmann, B. (author) / Jantz, W. / Baeumler, M.

    Published in:

    Solid-State Materials for Advanced Technology ; 238-241

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 44

    Publication date:

    1997-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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