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Application of electron beam lithography to study microcreep deformation and grain boundary sliding

Kishimoto, S. / Shinya, N. / Mathew, M. D.

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Application of electron beam lithography to study microcreep deformation and grain boundary sliding

Kishimoto, S. / Shinya, N. / Mathew, M. D.

Application of electron beam lithography to study microcreep deformation and grain boundary sliding

Kishimoto, S. / Shinya, N. / Mathew, M. D.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Application of electron beam lithography to study microcreep deformation and grain boundary sliding

Contributors:

Kishimoto, S. (author) / Shinya, N. (author) / Mathew, M. D. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 32 ; 3411-3417

Publication date:

1997-01-01

Size:

7 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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