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    Hall Effect Measurements on Transmutation Doped Semiconductors

    New search for: Rohrlack, G.
    New search for: Freitag, K.
    New search for: Von Nathusius, C.
    New search for: Vianden, R.
    New search for: Gwilliam, R.
    New search for: Sealy, B. J.
    New search for: Balogh, A. G.
    New search for: Walter, G.

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    Hall Effect Measurements on Transmutation Doped Semiconductors

    New search for: Rohrlack, G.
    New search for: Freitag, K.
    New search for: Von Nathusius, C.
    New search for: Vianden, R.
    New search for: Gwilliam, R.
    New search for: Sealy, B. J.
    New search for: Balogh, A. G.
    New search for: Walter, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Hall Effect Measurements on Transmutation Doped Semiconductors

    New search for: Rohrlack, G.
    New search for: Freitag, K.
    New search for: Von Nathusius, C.
    New search for: Vianden, R.
    New search for: Gwilliam, R.
    New search for: Sealy, B. J.
    New search for: Balogh, A. G.
    New search for: Walter, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Hall Effect Measurements on Transmutation Doped Semiconductors

    Contributors:

    Rohrlack, G. (author) / Freitag, K. (author) / Von Nathusius, C. (author) / Vianden, R. (author) / Gwilliam, R. (author) / Sealy, B. J. (author) / Balogh, A. G. / Walter, G.

    Published in:

    Materials Science Applications of Ion Beam Techniques ; 119-124

    MATERIALS SCIENCE FORUM ; 248/249

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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