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Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects
Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects
Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects
Gebauer, J. (author) / Krause-Rehberg, R. (author) / Domke, C. (author) / Ebert, P. (author) / Urban, K. (author) / Jean, Y. C. / Eldrup, M. / Schrader, D. M. / West, R. N.
1997-01-01
3 pages
Article (Journal)
English
DDC:
620.11
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