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Structural Characterisation of GaN Layers on Sapphire Grown by MOCVD
Structural Characterisation of GaN Layers on Sapphire Grown by MOCVD
Structural Characterisation of GaN Layers on Sapphire Grown by MOCVD
Pecz, B. (author) / Di Forte-Poisson, M. A. (author) / Toth, L. (author) / Radnoczi, G. (author)
MATERIALS SCIENCE FORUM ; 264/268 ; 1255-1258
1998-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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