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    Electrical characterization of electron beam induced defects in epitaxially grown Si~1~-~xGe~x

    New search for: Mamor, M.
    New search for: Auret, F. D.
    New search for: Goodman, S. A.
    New search for: Myburg, G.
    New search for: Deenapanray, P. N. K.
    New search for: Meyer, W. E.

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    Electrical characterization of electron beam induced defects in epitaxially grown Si~1~-~xGe~x

    New search for: Mamor, M.
    New search for: Auret, F. D.
    New search for: Goodman, S. A.
    New search for: Myburg, G.
    New search for: Deenapanray, P. N. K.
    New search for: Meyer, W. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electrical characterization of electron beam induced defects in epitaxially grown Si~1~-~xGe~x

    New search for: Mamor, M.
    New search for: Auret, F. D.
    New search for: Goodman, S. A.
    New search for: Myburg, G.
    New search for: Deenapanray, P. N. K.
    New search for: Meyer, W. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Electrical characterization of electron beam induced defects in epitaxially grown Si~1~-~xGe~x

    Contributors:

    Mamor, M. (author) / Auret, F. D. (author) / Goodman, S. A. (author) / Myburg, G. (author) / Deenapanray, P. N. K. (author) / Meyer, W. E. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 258/263 ; 115-120

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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