Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    EELS and Ab-Initio Study of Faceted CSL Boundary in Silicon

    New search for: Sakaguchi, N.
    New search for: Miyake, M.
    New search for: Watanabe, S.
    New search for: Takahashi, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    EELS and Ab-Initio Study of Faceted CSL Boundary in Silicon

    New search for: Sakaguchi, N.
    New search for: Miyake, M.
    New search for: Watanabe, S.
    New search for: Takahashi, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    EELS and Ab-Initio Study of Faceted CSL Boundary in Silicon

    New search for: Sakaguchi, N.
    New search for: Miyake, M.
    New search for: Watanabe, S.
    New search for: Takahashi, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    EELS and Ab-Initio Study of Faceted CSL Boundary in Silicon

    Contributors:

    Sakaguchi, N. (author) / Miyake, M. (author) / Watanabe, S. (author) / Takahashi, H. (author)

    Published in:

    New Trends for Micro- and Nano Analyses ; 276-279

    MATERIALS TRANSACTIONS ; 52

    Publication date:

    2011-01-01

    Size:

    4 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Atomic Structure of Faceted Sigma3 CSL Grain Boundary in Silicon: HRTEM and Ab-initio Calculation

    Sakaguchi, N. / Ichinose, H. / Watanabe, S. | British Library Online Contents | 2007

    High resolution EELS study of extended defects in silicon

    Kohno, H. / Arai, N. / Mabuchi, T. et al. | British Library Online Contents | 1997

    EELS investigation of luminescent nanoporous p-type silicon

    Berbezier, I. / Martin, J. M. / Bernardi, C. et al. | British Library Online Contents | 1996

    Faceted architectural fixtures

    KILIAN ROBERT / KABATSI CHRIS / KANE KEVIN et al. | European Patent Office | 2020

    Free access

    FACETED ARCHITECTURAL FIXTURES

    KILIAN ROBERT / KABATSI CHRIS / KANE KEVIN | European Patent Office | 2017

    Free access
    Back to top