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Characterisation of InGaAs/InP microscopic Hall probe arrays with a 2DEG active layer
Characterisation of InGaAs/InP microscopic Hall probe arrays with a 2DEG active layer
Characterisation of InGaAs/InP microscopic Hall probe arrays with a 2DEG active layer
Cambel, V. (author) / Gregusova, D. (author) / Elias, P. (author) / Hasenohrl, S. (author) / Olejnikova, B. (author) / Novak, J. (author) / Schaapers, T. (author) / Neurohr, K. (author) / Fox, A. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 51 ; 188-191
1998-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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