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Characterisation of InGaAs/InP microscopic Hall probe arrays with a 2DEG active layer
Characterisation of InGaAs/InP microscopic Hall probe arrays with a 2DEG active layer
Characterisation of InGaAs/InP microscopic Hall probe arrays with a 2DEG active layer
Cambel, V. (Autor:in) / Gregusova, D. (Autor:in) / Elias, P. (Autor:in) / Hasenohrl, S. (Autor:in) / Olejnikova, B. (Autor:in) / Novak, J. (Autor:in) / Schaapers, T. (Autor:in) / Neurohr, K. (Autor:in) / Fox, A. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 51 ; 188-191
01.01.1998
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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