On the development of InAs on GaAs(001) as measured by reflectance anisotropy spectroscopy: continuous and islanded films: Fid-Bau Portal

On the development of InAs on GaAs(001) as measured by reflectance anisotropy spectroscopy: continuous and islanded films

Westwood, D. I. / Sobiesierski, Z. / Steimetz, E. / Zettler, T. / Richter, W.

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On the development of InAs on GaAs(001) as measured by reflectance anisotropy spectroscopy: continuous and islanded films

Westwood, D. I. / Sobiesierski, Z. / Steimetz, E. / Zettler, T. / Richter, W.

On the development of InAs on GaAs(001) as measured by reflectance anisotropy spectroscopy: continuous and islanded films

Westwood, D. I. / Sobiesierski, Z. / Steimetz, E. / Zettler, T. / Richter, W.

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Check availability in my library

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Document information

Title:

On the development of InAs on GaAs(001) as measured by reflectance anisotropy spectroscopy: continuous and islanded films

Contributors:

Westwood, D. I. (author) / Sobiesierski, Z. (author) / Steimetz, E. (author) / Zettler, T. (author) / Richter, W. (author)

Published in:

APPLIED SURFACE SCIENCE ; 123/124 ; 347-351

Publication date:

1998-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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