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    Mapping residual stress using optical microprobe in alumina films formed by thermal oxidation of NiAl

    New search for: Atkinson, A.
    New search for: Clarke, D. R.
    New search for: Webb, S. J.

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    Mapping residual stress using optical microprobe in alumina films formed by thermal oxidation of NiAl

    New search for: Atkinson, A.
    New search for: Clarke, D. R.
    New search for: Webb, S. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Mapping residual stress using optical microprobe in alumina films formed by thermal oxidation of NiAl

    New search for: Atkinson, A.
    New search for: Clarke, D. R.
    New search for: Webb, S. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Mapping residual stress using optical microprobe in alumina films formed by thermal oxidation of NiAl

    Contributors:

    Atkinson, A. (author) / Clarke, D. R. (author) / Webb, S. J. (author)

    Published in:

    Layered structural materials '97 ; 531-534

    MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 14

    Publication date:

    1998-01-01

    Size:

    4 pages

    ISSN:

    0267-0836

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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